3.4 " Mixed Direct Search and Monte-Carlo Techniques produce Fast and Robust IC Parametric Yield Estimates ", J. Horan and C. Lyden, Cork Regional Techn. College, Ireland.

This paper presents a novel method for the prediction of parametric yield of CMOS IC's from correlated device data. The technique is a development of two techniques, "direct search"[1] and Monte-Carlo[2]. "Direct search" concentrates on delineating yield boundaries and performing an analytical integration in the process space to produce a yield, which is very fast. Monte-Carlo produces a yield by exhaustively sampling the entire process space is slow but extremely robust. The two techniques are combined by finding a yield boundary in a dominant direction with further localised sampling at this boudary. The result is a fast and robust technique.